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RT Book, Whole SR Print DC OPAC T1 Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends T2 Chemical analysis A1 Benninghoven, A. A1 Rüdenauer, F. G. A1 Werner, H. W. YR 1987 FD c1987 SP xxxv, 1227 p. K1 Secondary ion mass spectrometry PB John Wiley & Sons PP New York SN 0471010561 LA eng CL LCC:QD96.S43 CL DC19:543/.0873 NO "A Wiley-Interscience publication." NO Bibliography: p. 1125-1216 NO Includes index NO 書誌ID=BB00172520; NCID=BA00818946; LK [OPAC]https://lib.kitasato-u.ac.jp/opac/opac_details/?lang=0&amode=11&bibid=BB00172520 LK OL 30